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Raman scattering as a probe of the electronic structure of single‐wall carbon nanotubes under high pressure

Raman scattering as a probe of the electronic structure of single‐wall carbon nanotubes under high pressure

Terekhov, S. V.; Obraztsova, E. D.; Hochheimer, H. D.; Teredesai, Pallavi V.; Yarger, J. L.; Osadchy, A. V.
URI: http://localhost:8080/xmlui/handle/123456789/85
Date: 2005

Description:

AIP Conf. Proc. 786, 166 (2005); http://dx.doi.org/10.1063/1.2103844 Conference date: 12-19 March 2005 Location: Kirchberg, Tirol (Austria)

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